@misc{Musioł_Krzysztof_Calibration,
 author={Musioł, Krzysztof and Kampik, Marian},
 howpublished={online},
 publisher={Zielona Góra: Uniwersytet Zielonogórski, Instytut Metrologii, Elektroniki i Informatyki},
 language={eng},
 abstract={Calibration procedure and requirements for self- and external calibration of National Instrument (NI) PXI data acquisition cards is presented in the paper. Calibration results of the PXI-446X cards used at Department of Measurement Science, Electronics and Control (KMEiA) of Silesian University of Technology are presented.},
 abstract={The results show that calibration procedure was successful and the metrological parameters of the PXI-446X devices used at KMEiA was improved. Measurement results obtained after adjustment differ from the reference values of the DC voltage calibrator used for the calibration purpose by no more than 0.7 mV.},
 type={rozdział w książce},
 title={Calibration of PXI data acquisition cards used for primary impedance metrology = Kalibracja kart akwizycji danych PXI wykorzystywanych w metrologii impedancyjnej wysokich dokładności},
 keywords={karty akwizycji danych PXI, kalibracja kart akwizycji danych, metrologia},
}