Szukana fraza: [Abstract = "It is widely known that pattern sensitive faults are the most difficult faults to detect during the RAM testing process. One of the techniques which can be used for effective detection of this kind of faults is the multi\-background test technique. According to this technique, multiple\-run memory test execution is done. In this case, to achieve a high fault coverage, the structure of the consecutive memory backgrounds and the address sequence are very important."]

Wyników: 1