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Search for: [Subject and Keywords = defects detection] OR [Subject and Keywords = image processing] OR [Subject and Keywords = local correlation] OR [Subject and Keywords = entropy map] OR [Title = Local correlation and entropy maps as tools for detecting defects in industrial images] OR [Creator = Skubalska\-Rafajłowicz, Ewa]

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AMCS, volume 30 (2020)

Babczyński, Tomasz Ptak, Roman Kołodziej, Joanna - ed. Pllana, Sabri - ed. Vitabile , Salvatore - ed.

2020
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