Obiekt
Tytuł: Local correlation and entropy maps as tools for detecting defects in industrial images
Współtwórca:
Kummert, Anton - ed. ; Rafajłowicz, Ewaryst - ed.
Podtytuł:
Tytuł publikacji grupowej:
Abstract:
The aim of this paper is to propose two methods of detecting defects in industrial products by an analysis of gray level images with low contrast between the defects and their background. An additional difficulty is the high nonuniformity of the background in different parts of the same image. ; The first method is based on correlating subimages with a nondefective reference subimage and searching for pixels with low correlation. To speed up calculations, correlations are replaced by a map of locally computed inner products. The second approach does not require a reference subimage and is based on estimating local entropies and searching for areas with maximum entropy. A nonparametric estimator of local entropy is also proposed, together with its realization as a bank of RBF neural networks. The performance of both methods is illustrated with an industrial image.
Wydawca:
Zielona Góra: Uniwersytet Zielonogórski
Identyfikator zasobu:
DOI:
Strony:
Źródło:
AMCS, volume 18, number 1 (2008) ; kliknij tutaj, żeby przejść
Jezyk:
Prawa do dysponowania publikacją:
Biblioteka Uniwersytetu Zielonogórskiego
Kolekcje, do których przypisany jest obiekt:
- Repozytorium > Jednostki organizacyjne > Wydział Informatyki, Elektrotechniki i Automatyki
- Repozytorium > Typy utworów > Artykuły
- Repozytorium > Czasopisma naukowe i serie wydawnicze UZ > International Journal of Applied Mathematics and Computer Science (AMCS) > International Journal of Applied Mathematics and Computer Science (AMCS) (2008)
Data ostatniej modyfikacji:
2024-04-08
Data dodania obiektu:
2024-04-04
Liczba wyświetleń treści obiektu:
29
Wszystkie dostępne wersje tego obiektu:
https://zbc.uz.zgora.pl/repozytorium/publication/88439
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International Journal of Applied Mathematics and Computer Science (AMCS)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 26 (2016)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 25 (2015)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 24 (2014)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 22 (2012)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 20 (2010)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 19 (2009)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 1 (2008)
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- Local correlation and entropy maps as tools for detecting defects in industrial images
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| Nazwa wydania | Data |
|---|---|
| Local correlation and entropy maps as tools for detecting defects in industrial images | 2024-04-08 |
