Digital Library of Zielona Góra contains 9 272 digital objects
Object
Title: Local correlation and entropy maps as tools for detecting defects in industrial images
Contributor:
Kummert, Anton - ed. ; Rafajłowicz, Ewaryst - ed.
Subtitle:
Group publication title:
Abstract:
The aim of this paper is to propose two methods of detecting defects in industrial products by an analysis of gray level images with low contrast between the defects and their background. An additional difficulty is the high nonuniformity of the background in different parts of the same image. ; The first method is based on correlating subimages with a nondefective reference subimage and searching for pixels with low correlation. To speed up calculations, correlations are replaced by a map of locally computed inner products. The second approach does not require a reference subimage and is based on estimating local entropies and searching for areas with maximum entropy. A nonparametric estimator of local entropy is also proposed, together with its realization as a bank of RBF neural networks. The performance of both methods is illustrated with an industrial image.
Publisher:
Zielona Góra: Uniwersytet Zielonogórski
Resource Identifier:
DOI:
Pages:
Source:
AMCS, volume 18, number 1 (2008) ; click here to follow the link
Language:
License CC BY 4.0:
Rights:
Biblioteka Uniwersytetu Zielonogórskiego
Object collections:
- Repository > Faculties > Faculty of Computer, Electrical and Control Engineering
- Repository > Types of work > Articles
- Repository > Scientific journals and UZ publishing series > International Journal of Applied Mathematics and Computer Science (AMCS) > International Journal of Applied Mathematics and Computer Science (AMCS) (2008)
Last modified:
Jul 14, 2025
In our library since:
Apr 4, 2024
Number of object content hits:
91
All available object's versions:
https://zbc.uz.zgora.pl/repozytorium/publication/88439
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 1 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 2 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 3 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 4 (2008)
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| Edition name | Date |
|---|---|
| Local correlation and entropy maps as tools for detecting defects in industrial images | Jul 14, 2025 |
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