Object
Title: Local detection of defects from image sequences
Contributor:
Korbicz, Józef (1951- ) - ed. ; Sauter, Dominique - ed.
Subtitle:
Group publication title:
Abstract:
Our aim is to discuss three approaches to the detection of defects in continuous production processes, which are based on local methods of processing image sequences. These approaches are motivated by and applicable to images of hot metals or other surfaces, which are uniform at a macroscopic level, when defects are not present. ; The first of them is based on the estimation of fractal dimensions of image cross-sections. The second and third approaches are compositions of known techniques, which are selected and tuned to our goal. We discuss their advantages and disadvantages, since they provide different information on defects. The results of their testing on 12 industrial images are also summarized.
Publisher:
Zielona Góra: Uniwersytet Zielonogórski
Resource Identifier:
DOI:
Pages:
Source:
AMCS, volume 18, number 4 (2008) ; click here to follow the link
Language:
Rights:
Biblioteka Uniwersytetu Zielonogórskiego
Object collections:
- Repository > Faculties > Faculty of Computer, Electrical and Control Engineering
- Repository > Types of work > Articles
- Repository > Scientific journals and UZ publishing series > International Journal of Applied Mathematics and Computer Science (AMCS)
- Repository > Scientific journals and UZ publishing series > International Journal of Applied Mathematics and Computer Science (AMCS) > International Journal of Applied Mathematics and Computer Science (AMCS) (2008)
Last modified:
Nov 8, 2024
In our library since:
Apr 8, 2024
Number of object content hits:
42
All available object's versions:
https://zbc.uz.zgora.pl/repozytorium/publication/88516
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International Journal of Applied Mathematics and Computer Science (AMCS)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 26 (2016)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 25 (2015)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 24 (2014)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 23 (2013)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 22 (2012)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 21 (2011)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 20 (2010)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 19 (2009)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 1 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 2 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 3 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 4 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 26 (2016)
| Edition name | Date |
|---|---|
| Local detection of defects from image sequences | Nov 8, 2024 |
