Obiekt
Tytuł: Local detection of defects from image sequences
Autor:
Rafajłowicz, Ewaryst (1953- ) ; Wnuk, Marek ; Rafajłowicz, Wojciech
Data wydania:
Typ zasobu:
Współtwórca:
Korbicz, Józef (1951- ) - ed. ; Sauter, Dominique - ed.
Podtytuł:
Tytuł publikacji grupowej:
Abstract:
Our aim is to discuss three approaches to the detection of defects in continuous production processes, which are based on local methods of processing image sequences. These approaches are motivated by and applicable to images of hot metals or other surfaces, which are uniform at a macroscopic level, when defects are not present. ; The first of them is based on the estimation of fractal dimensions of image cross-sections. The second and third approaches are compositions of known techniques, which are selected and tuned to our goal. We discuss their advantages and disadvantages, since they provide different information on defects. The results of their testing on 12 industrial images are also summarized.
Wydawca:
Zielona Góra: Uniwersytet Zielonogórski
Identyfikator zasobu:
DOI:
Strony:
Źródło:
AMCS, volume 18, number 4 (2008) ; kliknij tutaj, żeby przejść
Jezyk:
Prawa do dysponowania publikacją:
Biblioteka Uniwersytetu Zielonogórskiego
Kolekcje, do których przypisany jest obiekt:
- Repozytorium > Jednostki organizacyjne > Wydział Informatyki, Elektrotechniki i Automatyki
- Repozytorium > Typy utworów > Artykuły
- Repozytorium > Czasopisma naukowe i serie wydawnicze UZ > International Journal of Applied Mathematics and Computer Science (AMCS)
- Repozytorium > Czasopisma naukowe i serie wydawnicze UZ > International Journal of Applied Mathematics and Computer Science (AMCS) > International Journal of Applied Mathematics and Computer Science (AMCS) (2008)
Data ostatniej modyfikacji:
2024-11-08
Data dodania obiektu:
2024-04-08
Liczba wyświetleń treści obiektu:
42
Wszystkie dostępne wersje tego obiektu:
https://zbc.uz.zgora.pl/repozytorium/publication/88516
Wyświetl opis w formacie RDF:
Wyświetl opis w formacie OAI-PMH:
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International Journal of Applied Mathematics and Computer Science (AMCS)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 26 (2016)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 25 (2015)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 24 (2014)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 23 (2013)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 22 (2012)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 21 (2011)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 20 (2010)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 19 (2009)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 1 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 2 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 3 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 18, number 4 (2008)
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International Journal of Applied Mathematics and Computer Science (AMCS),volume 1 (1991)
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International Journal of Applied Mathematics and Computer Science (AMCS), volume 26 (2016)
| Nazwa wydania | Data |
|---|---|
| Local detection of defects from image sequences | 2024-11-08 |
