Obiekt
Tytuł: Bayesian reliability models of weibull systems: state of the art
Współtwórca:
Korbicz, Józef (1951- ) - red. ; Uciński, Dariusz - red.
Tytuł publikacji grupowej:
Abstract:
In the reliability modeling field, we sometimes encounter systems with uncertain structures, and the use of fault trees and reliability diagrams is not possible. To overcome this problem, Bayesian approaches offer a considerable efficiency in this context. This paper introduces recent contributions in the field of reliability modeling with the Bayesian network approach. Bayesian reliability models are applied to systems with Weibull distribution of failure. ; To achieve the formulation of the reliability model, Bayesian estimation of Weibull parameters and the model?s goodness-of-fit are evoked. The advantages of this modelling approach are presented in the case of systems with an unknown reliability structure, those with a common cause of failures and redundant ones. Finally, we raise the issue of the use of BNs in the fault diagnosis area.
Wydawca:
Zielona Góra: Uniwersytet Zielonogórski
Identyfikator zasobu:
DOI:
Strony:
Źródło:
AMCS, Volume 22, Number 3 (2012) ; kliknij tutaj, żeby przejść
Jezyk:
Prawa do dysponowania publikacją:
Biblioteka Uniwersytetu Zielonogórskiego
Kolekcje, do których przypisany jest obiekt:
- Repozytorium > Jednostki organizacyjne > Wydział Informatyki, Elektrotechniki i Automatyki
- Repozytorium > Typy utworów > Artykuły
- Repozytorium > Czasopisma naukowe i serie wydawnicze UZ > International Journal of Applied Mathematics and Computer Science (AMCS)
- Repozytorium > Czasopisma naukowe i serie wydawnicze UZ > International Journal of Applied Mathematics and Computer Science (AMCS) > International Journal of Applied Mathematics and Computer Science (AMCS) (2012)
Data ostatniej modyfikacji:
2024-11-05
Data dodania obiektu:
2018-09-10
Liczba wyświetleń treści obiektu:
171
Wszystkie dostępne wersje tego obiektu:
https://zbc.uz.zgora.pl/repozytorium/publication/55123
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| Nazwa wydania | Data |
|---|---|
| Bayesian reliability models of weibull systems: state of the art | 2024-11-05 |
