Korbicz, Józef (1951- ) - red. ; Uciński, Dariusz - red.
In the reliability modeling field, we sometimes encounter systems with uncertain structures, and the use of fault trees and reliability diagrams is not possible. To overcome this problem, Bayesian approaches offer a considerable efficiency in this context. This paper introduces recent contributions in the field of reliability modeling with the Bayesian network approach. Bayesian reliability models are applied to systems with Weibull distribution of failure. ; To achieve the formulation of the reliability model, Bayesian estimation of Weibull parameters and the model?s goodness-of-fit are evoked. The advantages of this modelling approach are presented in the case of systems with an unknown reliability structure, those with a common cause of failures and redundant ones. Finally, we raise the issue of the use of BNs in the fault diagnosis area.
Zielona Góra: Uniwersytet Zielonogórski
AMCS, Volume 22, Number 3 (2012) ; click here to follow the link
Biblioteka Uniwersytetu Zielonogórskiego
Jul 14, 2025
Sep 10, 2018
267
https://zbc.uz.zgora.pl/repozytorium/publication/55123
| Edition name | Date |
|---|---|
| Bayesian reliability models of weibull systems: state of the art | Jul 14, 2025 |
Amrani, Mohamed Benazzouz, Djamel Jurczak, Paweł - red.
Polanska, Joanna Damian, Borys Polanski, Andrzej Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Taheri, Sona Mammadov, Musa Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Laursen, Morten Blanke, Mogens Düştegör, Dilek Korbicz, Józef (1951- ) - ed. Sauter, Dominique - ed.
Kościelny, Jan Maciej Syfert, Michał Rostek, Kornel Sztyber, Anna Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Witczak, Marcin Pazera, Marcin Majdzik, Paweł Matysiak, Ryszard Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Niemann, Hans Henrik Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Pröll, Sebastian Lunze, Jan Jarmolowitz, Fabian Puig, Vicenç - ed. Sauter, Dominique - ed. Aubrun, Christophe - ed. Schulte, Horst - ed.